Research

Find some of our current projects and ongoing research:

Temperature Dependence and Low-Frequency Noise in Diodes

Temperature Dependence and Low-Frequency Noise in Diodes

This project investigates the characteristics and sources of low-frequency noise in diodes, providing a comprehensive analysis of noise behavior and its impact on diode performance.
Date: November 2024

Enhanced Model GaN Device for Digital Reliability and Radiation Effects Testing

Enhanced Model GaN Device for Digital Reliability and Radiation Effects Testing

This project focuses on assessing GaN device reliability and performance under radiation effects. The study aims to provide insights into the digital reliability of these devices.
Date: November 2024

Radiation Effects and Wide Bandgap Material in TCAD Simulation and Experimental Testing

Radiation Effects and Wide Bandgap Material in TCAD Simulation and Experimental Testing

This project investigates the radiation effects on wide bandgap materials using TCAD simulations and experimental testing. The goal is to enhance the understanding of material behavior under radiation exposure.
Date: January 2025

Radiation Effects on Shift Registers: Analysis and Reliability

Radiation Effects on Shift Registers: Analysis and Reliability

This project involves a comprehensive analysis of radiation effects on shift registers, aiming to understand their behavior and reliability under radiation exposure.
Date: December 2024